| PUFs: Myth, fact or busted? A security evaluation of physically unclonable functions (PUFs) cast in silicon S Katzenbeisser, Ü Kocabaş, V Rožić, AR Sadeghi, I Verbauwhede, ... International Workshop on Cryptographic Hardware and Embedded Systems, 283-301, 2012 | 360 | 2012 |
| Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS R Maes, V Rožić, I Verbauwhede, P Koeberl, E Van der Sluis, ... ESSCIRC (ESSCIRC), 2012 Proceedings of the, 486-489, 2012 | 177 | 2012 |
| ES-TRNG: A High-throughput, Low-area True Random Number Generator based on Edge Sampling B Yang, V Rožic, M Grujic, N Mentens, I Verbauwhede IACR Transactions on Cryptographic Hardware and Embedded Systems, 267-292, 2018 | 81 | 2018 |
| Highly efficient entropy extraction for true random number generators on FPGAs V Rozic, B Yang, W Dehaene, I Verbauwhede 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC), 1-6, 2015 | 77 | 2015 |
| IoT: Source of test challenges EJ Marinissen, Y Zorian, M Konijnenburg, CT Huang, PH Hsieh, ... 2016 21th IEEE European Test Symposium (ETS), 1-10, 2016 | 42 | 2016 |
| Design solutions for securing SRAM cell against power analysis V Rožić, W Dehaene, I Verbauwhede Hardware-Oriented Security and Trust (HOST), 2012 IEEE International …, 2012 | 38 | 2012 |
| TOTAL: TRNG On-the-fly Testing for Attack detection using Lightweight hardware B Yang, V Rozic, N Mentens, W Dehaene, I Verbauwhede Proceedings of the 2016 Conference on Design Automation & Test in Europe (DATE), 2016 | 37 | 2016 |
| Iterating Von Neumann's Post-Processing under Hardware Constraints V Rožić, B Yang, W Dehaene, I Verbauwhede 2016 IEEE International Symposium on Hardware Oriented Security and Trust …, 2016 | 32 | 2016 |
| Low-cost implementations of on-the-fly tests for random number generators F Veljković, V Rožić, I Verbauwhede Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012 …, 2012 | 32 | 2012 |
| A highly-portable true random number generator based on coherent sampling A Peetermans, V Rozic, I Verbauwhede 2019 29th International Conference on Field Programmable Logic and …, 2019 | 31 | 2019 |
| Design and testing methodologies for true random number generators towards industry certification J Balasch, F Bernard, V Fischer, M Grujić, M Laban, O Petura, V Rožić, ... 2018 IEEE 23rd European Test Symposium (ETS), 1-10, 2018 | 27 | 2018 |
| Exploring Active Manipulation Attacks on the TERO Random Number Generator C Yang, V Rozic, B Yang, J Balasch, I Verbauwhede 59th Midwest Symposium on Circuits and Systems (MWSCAS 2016), 2016 | 27 | 2016 |
| On-the-fly tests for non-ideal true random number generators B Yang, V Rožić, N Mentens, I Verbauwhede 2015 IEEE International Symposium on Circuits and Systems (ISCAS), 2017-2020, 2015 | 25 | 2015 |
| Evolving Cryptographic Pseudorandom Number Generators S Picek, D Sisejkovic, V Rozic, B Yang, D Jakobovic, N Mentens International Conference on Parallel Problem Solving from Nature, 613-622, 2016 | 23 | 2016 |
| On-chip jitter measurement for true random number generators B Yang, V Rozic, M Grujic, N Mentens, I Verbauwhede 2017 Asian Hardware Oriented Security and Trust Symposium (AsianHOST), 91-96, 2017 | 22 | 2017 |
| A Closer Look at the Delay-Chain based TRNG M Grujić, V Rožić, B Yang, I Verbauwhede Circuits and Systems (ISCAS), 2018 IEEE International Symposium on, 1-5, 2018 | 20 | 2018 |
| Hardware-Efficient Post-processing Architectures for True Random Number Generators V Rožić, I Verbauwhede IEEE Transactions on Circuits and Systems II: Express Briefs, 2018 | 18 | 2018 |
| Three phase dynamic current mode logic: a more secure DyCML to achieve a more balanced power consumption H Kim, V Rozic, I Verbauwhede International Workshop on Information Security Applications, 68-81, 2012 | 18 | 2012 |
| The impact of pulsed electromagnetic fault injection on true random number generators M Madau, M Agoyan, J Balasch, M Grujić, P Haddad, P Maurine, V Rožić, ... 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), 43-48, 2018 | 17 | 2018 |
| Embedded HW/SW platform for on-the-fly testing of true random number generators B Yang, V Rožić, N Mentens, W Dehaene, I Verbauwhede Proceedings of the 2015 Design, Automation & Test in Europe Conference …, 2015 | 17 | 2015 |
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